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High Voltage Tester

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■ The BT (bias thermal stress test) test can be performed by applying high voltage to SIC / HV FET / IGBT and other power devices

■ Used to evaluate high voltage equipment used in automobiles, railways, etc


■ Gate BT 1nA to 10μA

■ Drain BT test 1μA to 30mA

■ /Id measurements from 1μA to 30mA

■ /Vg monitor -30V to +30V


■ The voltage can be up to 2000V and 16CH / unit can be applied simultaneously

■ Gate application ±30V 30mA (in-unit power supply)

■ Drain application high voltage 2kV 30mA (external power supply)

■ Drain application low voltage +30V 30mA (in-unit power supply)


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+86-10-6505-5534 (Beijing) +86-22-5883-5526 (Tianjin)
sankyo@northsankyo.com
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